RELATION OF COERCIVE FORCE TO STRUCTURAL PROPERTIES OF ELECTROPLATED FILMS

Abstract

Coercive forces (He) of Fe–Ni films were observed to depend on thickness, Fe/Ni ratio, and preferred crystal orientation in accordance with predictions based on the Behringer–Smith model. Annealing induces marked crystal growth and orientation of [111] axis normal to the plane in the Ni-rich films (> 80% Ni), but only moderate growth in the Fe-rich (< 80% Ni) films. He for Ni-rich films increases markedly while He for iron-rich films decreases slightly due to annealing. Variations of the anisotropy field, Hk, due to applied stress, indicate that reduction of He for the Fe-rich films results from moderate crystal growth while the increase of He for the Ni-rich films is due to the preferred orientation.