X-ray spectroscopy with variable line spacing based on reflection zone plate optics-Reference-Cited by-同舟云学术

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X-ray spectroscopy with variable line spacing based on reflection zone plate optics

Published:2018-09-10 Issue:18 Volume:43 Page:4390
ISSN:0146-9592
Container-title:Optics Letters
language:en
Short-container-title:Opt. Lett.

Author:

Yin Zhong^ORCID,Löchel Heike,Rehanek Jens^ORCID,Goy Claudia,Kalinin Anton,Schottelius Alexander,Trinter Florian,Miedema Piter^ORCID,Jain Avni,Valerio Joana,Busse Philipp,Lehmkühler Felix^ORCID,Möller Johannes,Grübel Gerhard,Madsen Anders,Viefhaus Jens,Grisenti Robert E.,Beye Martin^ORCID,Erko Alexei,Techert Simone

Funder

Deutsche Forschungsgemeinschaft (DFG)

Max-Planck-Gesellschaft (MPG)

Helmholtz Association

Bundesministerium für Bildung und Forschung (BMBF)

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference35 articles.

1. Electron spectroscopy for atoms, molecules, and condensed matter

2. Diffraction Properties of Periodic Lattices under Free Electron Laser Radiation

3. Influence of the Water Structure on the Acetylcholinesterase Efficiency

4. High-Resolution X-ray Emission and X-ray Absorption Spectroscopy

5. Soft x‐ray emission spectroscopy using monochromatized synchrotron radiation (invited)

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