Determination of thickness, refractive index, and thickness irregularity for semiconductor thin films from transmission spectra
Author:
Publisher
The Optical Society
Reference23 articles.
1. Determination of the thickness and optical constants of amorphous silicon
2. Determination of surface roughness and optical constants of inhomogeneous amorphous silicon films
3. Optical characterization of dielectric and semiconductor thin films by use of transmission data
4. A simple method to determine the optical constants and thicknesses of ZnxCd1−xS thin films
5. A simple method for the determination of the optical constants n, k and the thickness of a weakly absorbing thin film
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