Wide-view and accurate deformation measurement at microscales by phase extraction of scanning moiré pattern with a spatial phase-shifting technique
Author:
Funder
Japan Society for the Promotion of Science
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering
Reference35 articles.
1. Microcreep deformation measurements by a moire method using electron beam lithography and electron beam scan
2. The Grid Method for In-plane Displacement and Strain Measurement: A Review and Analysis
3. Applications of digital-image-correlation techniques to experimental mechanics
4. 2D strain mapping using scanning transmission electron microscopy Moiré interferometry and geometrical phase analysis
5. Windowed Fourier transform for fringe pattern analysis
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