Advanced broadband monitoring for thin film deposition through equivalent optical admittance loci observation
Author:
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics
Reference10 articles.
1. Optical monitoring of nonquarterwave stacks
2. Turning Value Monitoring of Narrow-band All-dielectric Thin-film Optical Filters
3. Improvement of the optical coating process by cutting layers with sensitive monitoring wavelengths
4. Interest of broadband optical monitoring for thin-film filter manufacturing
5. In-situ broadband monitoring of heterogeneous optical coatings
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