Photometric methods for determining the optical constants and the thicknesses of thin absorbing films: criteria for precise and unambiguous determination of n, k, and d in a wide spectral range-Reference-Cited by-同舟云学术

Photometric methods for determining the optical constants and the thicknesses of thin absorbing films: criteria for precise and unambiguous determination of n, k, and d in a wide spectral range

Published:2001-06-01 Issue:16 Volume:40 Page:2682
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Babeva Tzwetanka,Kitova Snejana,Konstantinov Ivan

Publisher

The Optical Society

Reference10 articles.

1. Photometric methods for determining the optical constants and the thicknesses of thin absorbing films: selection of a combination of photometric quantities on the basis of error analysis

2. The determination of the optical constants of thin films from measurements of reflectance and transmittance at normal incidence

3. Inversion of normal-incidence (R,T) measurements to obtain n + ik for thin films

4. Problem of ambiguity in the determination of optical constants of thin absorbing films from spectroscopic reflectance and transmittance measurements

5. Optical-standard surfaces of single-crystal silicon for calibrating ellipsometers and reflectometers

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