Accuracy of a multiple height-transfer interferometric technique for absolute distance metrology-Reference-Cited by-同舟云学术

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Accuracy of a multiple height-transfer interferometric technique for absolute distance metrology

Published:2012-07-19 Issue:21 Volume:51 Page:5283
ISSN:1559-128X
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Yu Hao,Aleksoff Carl,Ni Jun

Funder

National Institute of Standards and Technology Advanced Technology Program

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering

Reference22 articles.

1. Testing Aspherics Using Two-Wavelength Holography

2. Two-wavelength phase shifting interferometry

3. Step height measurement using two-wavelength phase-shifting interferometry

4. Extending the unambiguous range of two-color interferometers

5. Absolute interferometric distance measurements applying a variable synthetic wavelength

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1. Synchronous filtering method for improving the optical signal-to-noise ratio of a tunable laser based on the Fabry-Pérot interferometer;Optics Express;2024-02-16

2. Input trajectory shaping based on a B-spline model for the scanning control of a piezoelectric actuator in external-cavity diode laser;Mechanical Systems and Signal Processing;2019-02

3. Measurement and Model Reconstruction of Topography of Sealing Plane Based on Digital Holography;Acta Optica Sinica;2018

4. Absolute group refractive index measurement of air by dispersive interferometry using frequency comb;Optics Express;2015-12-21

5. Algebraic solution for phase unwrapping problems in multiwavelength interferometry;Applied Optics;2014-06-09

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