Measuring the thickness profiles of wafers to subnanometer resolution using Fabry-Perot interferometry
Author:
Publisher
The Optical Society
Reference15 articles.
1. The imaging magnetograph eXperiment for the SUNRISE balloon Antarctica project
2. High accuracy measurement of the residual air gap thickness of thin-film and solid-spaced filters assembled by optical contacting
3. Tunable-Filter Imaging of Quasar Fields atz ~ 1. II. The Star-forming Galaxy Environments of Radio-loud Quasars
4. Distortion induced effects on the finesse of high-performance large-aperture Fabry-Perot etalon filters
5. Interferometric but nonspectroscopic technique for measuring the thickness of a transparent plate
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Surface profile measurement and parameter analysis of silicon wafers in the upright state;Applied Optics;2024-03-25
2. Characterization of rubidium thin cell properties with sandwiched structure using a multipath interferometer with an optical frequency comb;Optics Letters;2021-08-26
3. Fabrication and metrology of lithium niobate narrowband optical filters for the solar orbiter;Advanced Optical Technologies;2014-01-01
4. Thickness and refractive index measurement of a silicon wafer based on an optical comb;Optics Express;2010-08-12
5. Design of multiaperture masks for subnanometer correction of ultraprecision optical components;Applied Optics;2007-08-27
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3