Optical and interfacial layer properties of SiO2 films deposited on different substrates-Reference-Cited by-同舟云学术

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Optical and interfacial layer properties of SiO2 films deposited on different substrates

Published:2013-11-15 Issue:4 Volume:53 Page:A83
ISSN:1559-128X
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Jiang Yugang,Liu Huasong,Wang Lishuan,Liu Dandan,Jiang Chenghui,Cheng Xinbin,Yang Yaping,Ji Yiqin

Funder

National Natural Science Foundation of China (NSFC)

Science and Technology Commission of Tianjin Municipality

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering

Reference15 articles.

1. Antireflection microstructures fabricated upon fluorine-doped SiO_2 films

2. Laser conditioning and multi-shot laser damage accumulation effects of HfO2/SiO2 antireflective coatings

3. Toward a new generation of low-loss mirrors for the advanced gravitational waves interferometers

4. Laser damage study of nodules in electron-beam-evaporated HfO_2/SiO_2 high reflectors

5. Mechanical and thermoelastic characteristics of optical thin films deposited by dual ion beam sputtering

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1. Effects of the thermal treatments on the optical properties of SiO2 anti-reflective coatings on sapphire windows;Infrared Physics & Technology;2024-03

2. Optimization of The Thickness of Single-Layer Antireflection SiO$${}_{\mathbf{2}}$$ Coating on a Silicon Photodiode Depending of the Characteristics of Incident Light;Optoelectronics, Instrumentation and Data Processing;2023-10

3. The quality studies of vertical graphene nanosheets catalyst-free microwave plasma-enhanced chemical vapor deposited on glass and fused silica;Physica B: Condensed Matter;2023-08

4. Atomistic Simulation of Physical Vapor Deposition of Optical Thin Films;Nanomaterials;2023-05-24

5. Ion beam assisted electron beam vacuum deposition of antireflective SiO₂coating on MgAl₂O₄spinel;International Journal of Applied Ceramic Technology;2023-02-16

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