Author:
Ferrero A.,Campos J.,Perales E.,Martínez-Verdú F. M.,van der Lans I.,Kirchner E.
Funder
European Metrology Research Programme
Ministerio de Economía y Competitividad (MINECO)
Subject
Computer Vision and Pattern Recognition,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Cited by
12 articles.
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