Multiplication sampling moire method for full-field deformation measurement of composite materials
Author:
Funder
Japan Society for the Promotion of Science
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics
Reference23 articles.
1. Estimating residual stresses of silicon wafer from measured full-field deflection distribution
2. Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry
3. Accuracy of phase shifting interferometry
4. Sampling Moiré Method for Accurate Small Deformation Distribution Measurement
5. Two-dimensional Moiré phase analysis for accurate strain distribution measurement and application in crack prediction
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2. Microscale strain distribution measurement before and after crack and delamination occurrence in CFRP laminates by multiplication sampling moiré method;International Conference on Optical and Photonic Engineering (icOPEN 2023);2024-02-15
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