Imaging reflectometry in situ
Author:
Publisher
The Optical Society
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1. A Spectroscopic Reflectance-Based Low-Cost Thickness Measurement System for Thin Films: Development and Testing;Sensors;2023-06-04
2. A novel method to design and evaluate artificial neural network for thin film thickness measurement traceable to the length standard;Scientific Reports;2022-02-09
3. Improved Measurement of Thin Film Thickness in Spectroscopic Reflectometer Using Convolutional Neural Networks;International Journal of Precision Engineering and Manufacturing;2019-10-24
4. Accurate determination of two-dimensional thin film thickness in spectroscopic imaging reflectometer using color camera and tunable aperture;Optics Communications;2019-03
5. Simple method for volumetric thickness measurement using a color camera;Applied Optics;2018-09-10
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