Possibility of a Phase Contrast Electron Microscope
Author:
Publisher
The Optical Society
Reference15 articles.
1. Thickness Estimation of Carbon Films by Electron Microscopy of Transverse Sections and Optical Density Measurements
2. A Recording Detection System for Quantitation of Electron Microscope Image Contrast Using a Retractable Micro‐Faraday Cage Probe
3. Interferenzmikroskopie mit Elektronenwellen
4. A theoretical consideration of some defects in electron optical images. A formulation of the problem for the incoherent case
5. Intensity Distributions in Electron Interference Phenomena Produced by an Electrostatic Bi-prism
Cited by 14 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Notes and References;Principles of Electron Optics, Volume 3;2022
2. Phase plates in the transmission electron microscope: operating principles and applications;Microscopy;2020-11-15
3. Direct measurement of electrostatic fields within the Zernike electrostatic phase plate using single 155 nm Teflon nanoparticle attached to the pillar-shaped atomic force microscope tip;Journal of Vacuum Science & Technology B;2019-05
4. On-Chip Thin Film Zernike Phase Plate for In-Focus Transmission Electron Microscopy Imaging of Organic Materials;ACS Nano;2012-12-26
5. Zernike Phase Contrast Cryo-Electron Microscopy and Tomography for Structure Determination at Nanometer and Subnanometer Resolutions;Structure;2010-08
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3