One-shot profile inspection for surfaces with depth, color and reflectivity discontinuities

Author:

Su Wei-Hung,Chen Sih-Yue

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Cited by 11 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Error-controlled decoding in phase unwrapping for phase-shifting projected fringe profilometry;Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XVII;2023-10-05

2. Phase-shifting projected fringe profilometry by binary-encoded projections;Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XVI;2022-10-03

3. Phase-Shifting Projected Fringe Profilometry Using Binary-Encoded Patterns;Photonics;2021-08-29

4. Error-corrected fringe discrimination using nonary-encoded patterns for phase-shifting projected fringe profilometry;Optics and Lasers in Engineering;2021-06

5. Accurate feature point detection method exploiting the line structure of the projection pattern for 3D reconstruction;Applied Optics;2021-04-05

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