X-ray micro-beam characterization of an elastically bent thin diamond plate for x-ray optics applications

Abstract

Insufficient information on the diffraction and energy-dispersion properties of elastically bent diamond limits its range of application in X-ray optics. Laue micro-beam diffraction has excellent potential for studying these properties. With this method, we explained the origin of the Laue spots asterism, calculated the strain–stress fields generated due to the bending of the diamond plate, and determined the bending radius in situ with high accuracy. The method can be used to control the dispersion characteristics of bent plates by changing the x-ray beam diameter or bending radius. Important conclusions are drawn for practical application of bent diamonds.