Simultaneous displacement and slope measurement in electronic speckle pattern interferometry using adjustable aperture multiplexing
Author:
Funder
China Scholarship Council (CSC)
Publisher
The Optical Society
Reference14 articles.
1. Speckle Interferometry: A Review of the Principal Methods in Use for Experimental Mechanics Applications
2. Shearography technology and applications: a review
3. Performance of spatial vs. temporal phase shifting in ESPI
4. Review and comparison of temporal- and spatial-phase shift speckle pattern interferometry for 3D deformation measurement
5. Simultaneous measurement of out-of-plane displacement and slope using a multiaperture DSPI system and fast Fourier transform
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