New parallel wavelength-dispersive spectrometer based on scanning electron microscope-Reference-Cited by-同舟云学术

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New parallel wavelength-dispersive spectrometer based on scanning electron microscope

Published:2014-07-02 Issue:14 Volume:22 Page:16897
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Erko Alexei,Firsov Alexander,Gubzhokov Renat,Bjeoumikhov Anjuar,Günther Andreas,Langhoff Norbert,Bretschneider Mario,Höhn Yvonne,Wedell Reiner

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference11 articles.

1. Development of wavelength-dispersive soft X-ray emission spectrometers for transmission electron microscopes--an introduction of valence electron spectroscopy for transmission electron microscopy

2. Diffraction efficiencies of holographic laminar and blazed types gratings for use in a flat-field spectrograph in the 50-200 eV range for transmission electron microscopes

3. 2D focusing with an off-axis elliptical Bragg-Fresnel multilayer lens and application to X-ray imaging

4. A Grazing Incidence Monochromator With A Varied-Space Plane Grating For Synchrotron Radiation

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3. Calculation of emission spectra of lithium compounds;X-Ray Spectrometry;2023-01-08

4. Soft X-ray spectrometers based on aperiodic reflection gratings and their application;Physics-Uspekhi;2021-08-01

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