Determining the refractive index and thickness of thin films from prism coupler measurements-Reference-Cited by-同舟云学术

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Determining the refractive index and thickness of thin films from prism coupler measurements

Published:1981-06-15 Issue:12 Volume:20 Page:2085
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Kirsch Steven T.

Publisher

The Optical Society

Reference8 articles.

1. Measurement of Thin Film Parameters with a Prism Coupler

2. Numerical solution of the mode-equation of planar dielectric waveguides to determine their refractive index and thickness by means of a prism-film coupler

3. An error analysis of the SYNCANG and SYNCWANG methods for the measurement of film refractive index and thickness

4. A quick method for determining the characteristics of a step index optical waveguide

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