Simultaneous measurement of surface shape and variation in optical thickness of a transparent parallel plate in wavelength-scanning Fizeau interferometer-Reference-Cited by-同舟云学术

Simultaneous measurement of surface shape and variation in optical thickness of a transparent parallel plate in wavelength-scanning Fizeau interferometer

Published:2004-02-20 Issue:6 Volume:43 Page:1241
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Hibino Kenichi,Oreb Bozenko F.,Fairman Philip S.,Burke Jan

Publisher

The Optical Society

Reference24 articles.

1. Digital wave-front measuring interferometry: some systematic error sources

2. Digital phase-measuring interferometry with a tunable laser diode

3. Separate measurements of surface shapes and refractive index inhomogeneity of an optical element using tunable-source phase shifting interferometry

4. Axial eye-length measurement by wavelength-shift interferometry

5. Fourier-transform speckle profilometry: three-dimensional shape measurements of diffuse objects with large height steps and/or spatially isolated surfaces

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