Integrated optical frequency domain reflectometry device for characterization of complex integrated devices
Author:
Funder
Generalitat Valenciana
Ministerio de Economía y Competitividad (MINECO)
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics
Reference14 articles.
1. Optical frequency domain reflectometry in single‐mode fiber
2. Coherent frequency-domain reflectometry for characterization of single-mode integrated-optical waveguides
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5. Roughness Induced Backscattering in Optical Silicon Waveguides
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