Fourier fringe analysis and its application to metrology of extreme physical phenomena: a review [Invited]-Reference-Cited by-同舟云学术

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Fourier fringe analysis and its application to metrology of extreme physical phenomena: a review [Invited]

Published:2012-12-21 Issue:1 Volume:52 Page:20
ISSN:1559-128X
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Takeda Mitsuo

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering

Reference71 articles.

1. V Phase-Measurement Interferometry Techniques

2. IV Advanced Evaluation Techniques in Interferometry

3. Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry

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