Efficient layout-aware statistical analysis for photonic integrated circuits-Reference-Cited by-同舟云学术

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Efficient layout-aware statistical analysis for photonic integrated circuits

Published:2020-03-02 Issue:6 Volume:28 Page:7799
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Jhoja Jaspreet,Lu Zeqin,Pond James,Chrostowski Lukas

Funder

Natural Sciences and Engineering Research Council of Canada

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference15 articles.

1. Design Challenges in Silicon Photonics

2. Performance prediction for silicon photonics integrated circuits with layout-dependent correlated manufacturing variability

3. Layout-Aware Variability Analysis, Yield Prediction, and Optimization in Photonic Integrated Circuits

4. Subnanometer Linewidth Uniformity in Silicon Nanophotonic Waveguide Devices Using CMOS Fabrication Technology

5. Silicon photonics manufacturing

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1. Efficient Verilog-A based time-domain variability analysis method for passive photonic integrated circuits;Optics Express;2024-05-06

2. 大规模硅基光电子集成芯片技术与挑战（特邀）;Acta Optica Sinica;2024

3. Inverse design of robust photonic components;Integrated Optics: Devices, Materials, and Technologies XXVII;2023-03-17

4. Modelling Fabrication Variability in Silicon Photonic Devices;Photonic Materials: Recent Advances and Emerging Applications;2023-01

5. Experimental demonstration of robust nanophotonic devices optimized by topological inverse design with energy constraint;Photonics Research;2022-06-30

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