Pulse-width-dependent critical power for self-focusing of ultrashort laser pulses in bulk dielectrics

Abstract

Microscale filamentation of 0.25 NA-focused, linearly and circularly polarized 1030 nm and 515 nm ultrashort laser pulses of variable pulse widths in fused silica, fluorite, and natural and synthetic diamonds demonstrates the Raman–Kerr effect in the form of critical pulse power magnitudes, proportional to squared wavelength and inversely proportional to laser pulse width of 0.3–10 ps. The first trend represents the common spectral relationship between the quantities, while the second indicates its time-integrated inertial contribution of Raman-active lattice polarization, appearing in transmission spectra via ultrafast optical-phonon Raman scattering. The optical-phonon contribution to the nonlinear polarization could come from laser field-induced spontaneous/stimulated Raman scattering and coherent optical phonons generated by electron–hole plasma with its clamped density in the nonlinear focus. Almost constant product value of the (sub)picosecond laser pulse widths and corresponding critical pulse powers for self-focusing and filamentation in the dielectrics (“critical pulse energy”) apparently implies constant magnitude of the nonlinear polarization and other “clamped” filamentation parameters at the given wavelength.