Determining thickness of films on a curved substrate by use of ellipsometric measurements
Author:
Publisher
The Optical Society
Reference6 articles.
1. The measurement of thin film stress using phase shifting interferometry
2. Ellipsometric Measurements and its Alignment: Using the Intensity Ratio Technique
3. Index Profile of Radial Gradient Index Lens Measured by Imaging Ellipsometric Technique
4. The Ellipsometric Measurements of a Curved Surface
5. Analytical solutions of the azimuthal deviation of a polarizer and an analyzer by polarizer-sample-analyzer ellipsometry
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3. Analytic solutions for calculating the surface inclination of isotropic media and bare substrates by using reflection-based generalized ellipsometry;Journal of Vacuum Science & Technology B;2020-05
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