Correlation between optical and topographical images from an external reflection near-field microscope with shear force feedback
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Publisher
The Optical Society
Reference9 articles.
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1. Simulation of topographic images and artifacts in illumination-mode scanning-near-field optical microscopy;Journal of the Optical Society of America A;2005-12-01
2. Lateral force measurement using a probe fiber as a microlens;Journal of Applied Physics;2004-05
3. Scanning near-field ellipsometric microscope-imaging ellipsometry with a lateral resolution in nanometer range;Applied Physics Letters;2001-09-10
4. Analysis of the effects arising from the near-field optical microscopy of homogeneous dielectric slabs;Optics Communications;2001-09
5. On contrast parameters and topographic artifacts in near-field infrared microscopy;Journal of Applied Physics;2000-12
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