Mask information-based gamma correction in fringe projection profilometry

Abstract

For fringe projection profilometry (FPP), the gamma effect of the camera and projector will cause non-sinusoidal distortion of the fringe patterns, leading to periodic phase errors and ultimately affecting the reconstruction accuracy. This paper presents a gamma correction method based on mask information. Since the gamma effect will introduce higher-order harmonics into the fringe patterns, on top of projecting two sequences of phase-shifting fringe patterns having different frequencies, a mask image is projected to provide enough information to determine the coefficients of higher-order fringe harmonics using the least-squares method. The true phase is then calculated using Gaussian Newton iteration to compensate for the phase error due to the gamma effect. It does not require projecting a large number of images, and only 2 × 3 phase shift patterns and 1 mask pattern minimum are required. Simulation and experimental results demonstrate that the method can effectively correct the errors caused by the gamma effect.