Affiliation:
1. University at Buffalo
2. Stony Brook University
Abstract
We present numerical simulations of scattering-type scanning near-field optical microscopy (s-SNOM) of 1D plasmonic graphene junctions. A comprehensive analysis of simulated s-SNOM spectra is performed for three types of junctions. We find conditions when the conventional interpretation of the plasmon reflection coefficients from s-SNOM measurements does not apply. Our approach can be used for other conducting 2D materials to provide a comprehensive understanding of the s-SNOM techniques for probing the local transport properties of 2D materials.
Funder
Office of the Vice President for Research and Economic Development, University at Buffalo
State University of New York
National Science Foundation
Solar System Exploration Research Virtual Institute
Subject
Atomic and Molecular Physics, and Optics
Cited by
1 articles.
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