Effect of the configuration mixing on the polarization and angular distribution of x-ray line emissions following electron-impact excitation of Ne-like ions

Author:

Yang Zhihao12ORCID,Chen Guangping12,Zhong Yan1,Zhang Caihong1,Tu Hong1,Luo Tianluo,He Zhencen,Hu Zhimin

Affiliation:

1. Sichuan University of Arts and Science

2. DaZhou Industrial Technology Institute of Intelligent Manufacturing

Abstract

We present a systematic theoretical study on the angular distribution and linear polarization of x-ray line emissions of neon-like ions following the electron-impact excitation from the ground state to the excited levels [(2p5)1/23d3/2]J=1, [(2p5)3/23d5/2]J=1, [(2p5)3/23d3/2]J=1, and [(2p5)1/23s]J=1. The cross sections are calculated by using the flexible atomic code under configuration-interaction plus many-body perturbation theory method. The angular distribution and linear polarization are obtained based on density matrix theory. Emphasis has been placed on the effect of the configuration mixing on the angular distribution and polarization. It has been proved that the strong mixing of configuration [(2p5)3/23d3/2]J=1 with configuration [(2p5)1/23s]J=1 can result in the abrupt change of Z-dependence of angular distribution and polarization. It indicates that angular distribution and polarization can be expected to serve as a tool for investigation of configuration mixing effect.

Funder

National Natural Science Foundation of China

Dazhou Science and Technology Program

Scientific Research Foundation of Sichuan University of Arts and Sciences

Publisher

Optica Publishing Group

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