Dual-wavelength and double-field-of-view quantitative phase microscopy using a Fresnel bi-prism

Abstract

We present a novel stable quantitative phase measurement technique for extending the imaging area sensing with the capability of recording two wavelengths in a single shot. For this purpose, each wavelength is separated into three beams using a Fresnel bi-prism and they interfere in the CCD camera by a simple optic alignment. The final pattern created in the camera with the six beam contained both wavelengths information that their field of view is extended two times. The feasibility of this technique is experimentally demonstrated by dispersion measurement of silica beads using two wavelengths image of two different areas of silica beads with a single image sensor.