Improvement of the optical coating process by cutting layers with sensitive monitoring wavelengths-Reference-Cited by-同舟云学术

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Improvement of the optical coating process by cutting layers with sensitive monitoring wavelengths

Published:2005 Issue:13 Volume:13 Page:4854
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Lee Cheng-Chung,Wu Kai,Kuo Chien-Cheng,Chen Sheng-Hui

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Cited by 26 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Noble Infrared Optical Thickness Monitoring System Based on the Algorithm of Phase-Locked Output Current–Reflectivity Coefficient;Coatings;2022-06-06

2. Determination of alternative monitoring wavelength to increase the accuracy of measuring the layers thickness during the thin films manufacture;Modeling Aspects in Optical Metrology VII;2019-06-21

3. Enhancing the Resistance of Spectral Characteristics of Interference Coatings to Deviation in Parameters of Layers Entering into Their Composition;Optics and Spectroscopy;2018-08

4. Optical monitoring strategies for optical coating manufacturing;Optical Thin Films and Coatings;2018

5. Fabrication of broadband antireflection coatings using broadband optical monitoring mixed with time monitoring;Chinese Physics B;2017-05

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