Raman fingerprints of different vanadium oxides as impurity phases in VO2 films
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Published:2024-02
Issue:
Volume:148
Page:114894
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ISSN:0925-3467
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Container-title:Optical Materials
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language:en
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Short-container-title:Optical Materials
Author:
Dzhagan V.M.ORCID,
Valakh M. Ya,
Isaieva O.F.ORCID,
Yukhymchuk V.O.ORCID,
Stadnik O.A.,
Gudymenko O. Yo,
Lytvyn P.M.,
Kulbachynskyi O.A.ORCID,
Yefanov V.S.,
Romanyuk B.M.,
Melnik V.P.
Cited by
1 articles.
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