1. Current and future challenges in radiation effects on CMOS electronics;Dodd;IEEE Transactions on Nuclear Science,2010
2. Conceptual design of a MGy tolerant integrated signal conditioning circuit in 130nm and 700nm CMOS;Verbeeck;Journal of Instrumentation,2012
3. Radiation induced edge effects in deep submicron CMOS transistors;Faccio;IEEE Transactions on Nuclear Science,2005
4. Investigating degradation mechanisms in 130nm and 90nm commercial CMOS technologies under extreme radiation conditions, RADECS 2007;Ratti;IEEE Transactions on Nuclear Science,2008
5. Y. Cao, P. Leroux, W. De Cock, M. Steyaert, A 1.7mW 11b 1-1-1 MASH ΔΣ time-to-digital converter, IEEE ISSCC, San Francisco, US, February 2011.