The growth behavior and stress evolution of sputtering-deposited LaNiO3 thin films
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference34 articles.
1. Ferroelectric properties of PZT films on LaNiO3 bottom electrode deposited under different oxygen partial pressure
2. Electrical properties of (Pb0.76Ca0.24)TiO3 thin films on LaNiO3 coated Si and fused quartz substrates prepared by a sol–gel process
3. Ferroelectric properties of Pb(Zr0.52Ti0.48)O3 thin films prepared by metal–organic decomposition process
4. Preparation of highly (100)-oriented LaNiO3 nanocrystalline films by metalorganic chemical liquid deposition
5. Ferroelectric properties of (Pb0.97La0.03)(Zr0.66Ti0.34)0.9875O3 films deposited on Si3N4-coated Si substrates by pulsed laser deposition process
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