1. X-ray line broadening from filed aluminium and wolfram
2. The Effect of Cold‐Work Distortion on X‐Ray Patterns
3. Applicabilities of the Warren–Averbach analysis and an alternative analysis for separation of size and strain broadening
4. P. Suortti, in: R.A. Young (Ed.), The Rietveld Method, IUCr Monographs on Crystallography, vol. 5, Oxford University Press, 1993, p. 167.
5. V. Honkimaki, P. Suortti, in: R.L. Snyder, J. Fiala, H.J. Bunge (Eds.), Defect and Microstructure Analysis by Diffraction, IUCr Monographs on Crystallography, Oxford University Press, New York, USA, 1999, p. 41.