1. Microbeam AMS: prospects of new geological applications;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1997-03
2. Ion Probe Microscopy;Advances in Optical and Electron Microscopy;1989
3. Cluster ions. I. Methods;Mass Spectrometry Reviews;1987
4. Analysis of solids by secondary ion and sputtered neutral mass spectrometry;Applied Physics A Solids and Surfaces;1985-08
5. A comparative study of methods for thin-film and surface analysis;Reports on Progress in Physics;1984-03-01