Author:
Park Byung-Nam,Sohn Young-Soo,Choi Sie-Young
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference22 articles.
1. [Back cover]
2. VLSI on-chip interconnection performance simulations and measurements
3. D.C. Edelstein,Technical Digest, IEEE International Electron Devices Meeting, 1997, p. 773.
Cited by
19 articles.
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