Reliability of charge trapping memories with high-k control dielectrics (Invited Paper)-Reference-Cited by-同舟云学术

Reliability of charge trapping memories with high-k control dielectrics (Invited Paper)

Published:2009-07 Issue:7-9 Volume:86 Page:1796-1803
ISSN:0167-9317
Container-title:Microelectronic Engineering
language:en
Short-container-title:Microelectronic Engineering

Author:

Molas G.,Bocquet M.,Vianello E.,Perniola L.,Grampeix H.,Colonna J.P.,Masarotto L.,Martin F.,Brianceau P.,Gély M.,Bongiorno C.,Lombardo S.,Pananakakis G.,Ghibaudo G.,De Salvo B.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference43 articles.

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