Electronic and crystal structure analyses of boron doped LiFeO2 cathode material by the XAFS spectroscopy-Reference-Cited by-同舟云学术

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Electronic and crystal structure analyses of boron doped LiFeO2 cathode material by the XAFS spectroscopy

Published:2022-06 Issue: Volume:31 Page:103571
ISSN:2352-4928
Container-title:Materials Today Communications
language:en
Short-container-title:Materials Today Communications

Author:

Gunaydin Selen,Harfouche Messaoud,Ozkendir O. Murat

Publisher

Elsevier BV

Subject

Materials Chemistry,Mechanics of Materials,General Materials Science

Reference21 articles.

1. Synchrotron facilities for advanced scientific oriented research;Gunaydin;Adv. J. Sci. Eng.,2020

2. IFEFFIT: interactive XAFS analysis and FEFF fitting;Newville;J. Synchrotron Rad.,2001

3. Simultaneous XAFS measurements of multiple samples;Ravel;J. Synchrotron Rad.,2010

4. Electronic structure study of Sn-substituted InP semiconductor;Ozkendir;Adv. J. Sci. Eng.,2020

5. XAFS Tekniği ile İkame Edilmiş Hafif Atomların Yer Tespiti;Ozkendir;Osman. Korkut Ata Univ. J. Nat. Appl. Sci.,2019

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Recent advances in battery characterization using in situ XAFS, SAXS, XRD, and their combining techniques: From single scale to multiscale structure detection;Exploration;2023-11-20

2. Temperature Dependency of Sodium Ionic Activity in β-NaFeO2 Material;Journal of Electronic Materials;2023-04-24

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