Author:
Jeong Jae-Seong,Lee Jae-Hyun,Ha Jong-Shin,Park Sang-Deuk
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference7 articles.
1. Determination of threshold failure levels of semiconductor diodes and transistors due to pulse voltages;Wunsch;IEEE Trans Nuc Sci,1968
2. Alexander Teverovsky, EOS Simulation and Failure Analysis of Metallurgically Bonded Silicon Diodes. Nasa whitepaper, 2001.
3. Chen Cixnan; Xie Guangrun; Xie Zifeng. An introduction to semiconductor lightning current duration extender. Power Engineering Society Winter Meeting, ’2000 Proceedings 2000, 2101–2106 vol. 3.
4. Satoh H, Shimoda, Y. Two-dimensional analysis of surge response in thyristor lightning surge protection devices. ISPSD ’96 Proceedings, 8th Pages:265–268.
5. Satoh H, Shimoda Y. Lightning surge protection semiconductor devices for subscriber telecommunication equipment, International Symposium on Electromagnetic Compatibility, IEEE ’996 proceedings 242–247.
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献