Stabilized emission from micro-field emitter for electron microscopy-Reference-Cited by-同舟云学术

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Stabilized emission from micro-field emitter for electron microscopy

Published:2006-07 Issue:7 Volume:46 Page:1209-1213
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Chen L.,El-Gomati M.M.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference20 articles.

1. A novel scanning tunneling microscope controlled field emission microlens electron source;McCord;J Vac Sci Technol,1989

2. Micromachined single-crystal silicon electron lenses;Hofmann;J Vac Sci Technol,1997

3. Experimental evaluation of a scanning tunneling microscope-microlens system;Muray;J Vac Sci Technol,1991

4. Sub-40nm resolution 1keV scanning tunneling microscope field-emission microcolumn;Kratschmer;J Vac Sci Technol,1994

5. Performance of Zr/O/W Schottky emitters at reduced temperatures;Kim;J Vac Sci Technol,1997

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