1. Structural In-Field Diagnosis for Random Logic Circuits, Sixteenth IEEE European Test Symposium, Trondheim;Cook,2011
2. Signature Based Diagnosis for Logic BIST, 2006 IEEE International Test Conference, Santa Clara, CA;Cheng,2006
3. A rapid and scalable diagnosis scheme for BIST environments with a large number of scan chains;Ghosh-Dastidar,2000
4. BISD: scan-based built-in self-diagnosis;Elm,2010
5. A mixed mode BIST scheme based on reseeding of folding counters;Hellebrand,2000