Diagnosis of a soft short and local variations of parameters occurring simultaneously in analog CMOS circuits-Reference-Cited by-同舟云学术

Diagnosis of a soft short and local variations of parameters occurring simultaneously in analog CMOS circuits

Published:2017-05 Issue: Volume:72 Page:90-97
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Tadeusiewicz Michał,Hałgas Stanisław

Funder

Statutory Activities of Lodz University of Technology

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference26 articles.

1. A modular fault–diagnosis system for analog electronic circuits using neural networks with wavelet transform as a preprocessor;Aminian;IEEE Trans. Instrum. Meas.,2007

2. BIST architecture for oscillation test of analog ICs and investigation of test hardware influence;Arbet;Microelectron. Reliab.,2014

3. Soft fault detection and isolation in analog circuits: some results and a comparison between a fuzzy approach and radial basis function networks;Catelani;IEEE Trans. Instrum. Meas.,2002

4. An unconditionally sound algorithm for testability analysis in linear time–invariant electrical networks;Fontana;Int. J. Circ. Theor. Appl.,2016

5. Advances in electronic testing;Gizopoulos,2006

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Novel Fault Diagnosis Based Improved WOA-BP for Analog Circuit;2024 IEEE 13th Data Driven Control and Learning Systems Conference (DDCLS);2024-05-17

2. A Novel Incipient Fault Diagnosis Method for Analogue Circuits Based on an MLDLCN;Circuits, Systems, and Signal Processing;2023-10-10

3. An incipient fault diagnosis method based on Att-GCN for analogue circuits;Measurement Science and Technology;2023-01-06

4. A Method for Diagnosing Soft Short and Open Faults in Distributed Parameter Multiconductor Transmission Lines;Electronics;2020-12-28