Author:
Roesch William J.,Rains Philip
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference5 articles.
1. Roesch W. Correlating quality and reliability: not your father’s bathtub curve. In: 2012 ROCS workshop, Boston, Massachusetts. p. 111–24.
2. Maverick manufacturing anomalies: what threat to reliability;Roesch;Compd Semicond Mag,2013
3. Roesch W, Brockett S. Natural failure mechanisms: analysis of actual field returns. In: 2006 ROCS workshop, San Antonio (Texas). p. 55–71.
4. Roesch W. Thermal acceleration of compound semiconductors in humidity. In: 2005 ROCS workshop, Palm Springs (CA). p. 111–22.
5. Roesch W. Measuring and comparing humidity acceleration factors of compound semiconductors. In: 2009 ROCS workshop, Greensboro (North Carolina). p. 125–36.