Author:
Yazdan Mehr M.,van Driel W.D.,Jansen K.M.B.,Deeben P.,Zhang G.Q.
Funder
Materials innovation institute
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference21 articles.
1. Industrial production of GaN and InGaN-light emitting diodes on SiC-substrates;Zehnder;J Cryst Growth,2001
2. Light emitting diodes reliability review;Chang;Microelectron Reliab,2012
3. Meneghini M, Trevisanello L, Podda S, Buso S, Spiazzi G, Meneghesso G, Zanoni E. Stability and performance evaluation of high-brightness light-emitting diodes under DC and pulsed bias conditions Proc SPIE; 2006. p. 63370R.
4. Accelerated life test of high brightness light emitting diodes;Trevisanello;IEEE Trans Dev Mater Reliab,2008
5. High temperature electro-optical degradation of InGaN/GaN HBLEDs;Meneghini;Microelectron Reliab,2007
Cited by
31 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献