IGBT chip current imaging system by scanning local magnetic field

Author:

Shiratsuchi Hiroaki,Matsushita Kohei,Omura Ichiro

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference10 articles.

1. Extraction of parasitics within wire-bond IGBT modules;Xing;Proc APEC’98,1988

2. Analysis of large area trench-IGBT current distribution under UIS test with the aid of lock-in thermography;Riccio;Proc 21th ESREF,2010

3. Analysis of current distribution on IGBT under unclamped inductive;Iwahashi;Proc. 23th ESREF,2012

4. Investigations on current filamentation of IGBTs under unclamped inductive switching conditions;Shoji;Proc ISPSD’05,2005

5. Simulation studies and modeling of short circuit current oscillations in IGBTs;Milady;Proc ISPSD’09,2009

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