Markov process based reliability model for laser diodes in space radiation environment-Reference-Cited by-同舟云学术

Markov process based reliability model for laser diodes in space radiation environment

Published:2014-12 Issue:12 Volume:54 Page:2735-2739
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Liu Yun,Zhao Shanghong,Yang Shengsheng,Li Yongjun,Qiang Ruoxin

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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4. A model for residual life prediction based on Brownian motion with an adaptive drift;Wang;Microelectron Reliab,2011

5. Sankararaman S, Daigle M, Saxena A, Goebel K. Analytical algorithms to quantify the uncertainty in remaining useful life prediction. In: IEEE aerospace conference; 2013.

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