Dynamic heavy ions SEE testing of NanoXplore radiation hardened SRAM-based FPGA: Reliability-performance analysis
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Published:2019-09
Issue:
Volume:100-101
Page:113437
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ISSN:0026-2714
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Container-title:Microelectronics Reliability
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language:en
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Short-container-title:Microelectronics Reliability
Author:
Oliveira A.,Benevenuti F.,Benites L.,Rodrigues G.,Kastensmidt F.,Added N.,Aguiar V.,Medina N.,Guazzelli M.,Tambara L.
Funder
Coordenação de Aperfeiçoamento de Pessoal de Nível Superior
Conselho Nacional de Desenvolvimento Científico e Tecnológico
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference14 articles.
1. SRAM based re-programmable FPGA for space applications;Wang;Trans. Nucl. Sci.,1999
2. ATMEL ATF280E rad hard SRAM based reprogrammable FPGA SEE test results;Mantelet;RADECS,2009
3. Radiation-Hardened, Space-Grade Virtex-5QV Family Data Sheet: Overview DS192, v1.6;Xilinx,2018
4. Ng-Medium NX1H35S Datasheet, Bi’evres, France, v1.6;NanoXplore,2018
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