Investigation of acoustic emission as a non-invasive method for detection of power semiconductor aging

Author:

Davari P.,Kristensen O.,Iannuzzo F.ORCID

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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