Author:
Soares Matheus Fay,Vargas Fabian Luis,D'Ornelas Benfica Juliano
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference15 articles.
1. Test Method Standard Microcircuits,2010
2. Electromagnetic Compatibility (EMC) - Part 4-4: Testing and Measurement Techniques - Electrical Fast Transient/Burst Immunity Test,2010
3. Electromagnetic Compatibility (EMC) Part 4-6: Testing and Measurement Techniques - Immunity to Conducted Disturbances, Induced by Radiofrequency Fields,2013
4. Microcontroller susceptibility variations to EFT burst during accelerated aging;Wu;Microelectron. Reliab.,2016
5. Investigation on the susceptibility of microcontrollers to EFT interference;Musolino,2005
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