Author:
Djedidi Oussama,Djeziri Mohand A.,Benmoussa Samir
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference55 articles.
1. J. Srinivasan, S. V. Adve, P. Bose, J. Rivers, C.-K. Hu, RAMP: A Model for Reliability Aware MicroProcessor Design, IBM Research Report 23048.
2. Data-driven approach for feature drift detection in embedded electronic devices;Djedidi;IFAC-PapersOnLine,2018
3. M. Djeziri, S. Benmoussa, E. Zio, Review of health indices extraction and trend modeling methods for remaining useful life estimation, in: M. Sayed-Mouchaweh (Ed.), Artificial Intelligence Techniques for a Scalable Energy Transition, Springer, 1 edn., ISBN 978-3-030-42725-2, VIII, 292, 2020.
4. A survey of fault diagnosis and fault-tolerant techniques-part II: fault diagnosis with knowledge-based and hybrid/active approaches;Gao;IEEE Trans. Ind. Electron.,2015
5. Differential evolution-based multi-objective optimization for the definition of a health indicator for fault diagnostics and prognostics;Baraldi;Mech. Syst. Signal Process.,2018
Cited by
9 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献